Bilang ng Bahagi :
SN74BCT8374ADWR
Tagagawa :
Texas Instruments
Paglalarawan :
IC SCAN TEST DEVICE W/FF 24-SOIC
Katayuan ng Bahagi :
Obsolete
Uri ng Lohika :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Pag-supply ng Boltahe :
4.5V ~ 5.5V
Temperatura ng pagpapatakbo :
0°C ~ 70°C
Uri ng Pag-mount :
Surface Mount
Pakete / Kaso :
24-SOIC (0.295", 7.50mm Width)
Package ng Tagabigay ng Device :
24-SOIC